| 000 | 00876 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250518011619.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a1533-4880 | ||
| 024 | 7 |
_a10.1166/jnn.2019.15996 _2doi |
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| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aWu, Chien-Hung | |
| 245 | 0 | 0 |
_aThe Effect of Microwave Annealing of Reliability Characteristics on Amorphous IGZO Thin Film Transistors. _h[electronic resource] |
| 260 |
_bJournal of nanoscience and nanotechnology _cApr 2019 |
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| 300 |
_a2189-2192 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aChang, Kow-Ming | |
| 700 | 1 | _aChen, Yi-Ming | |
| 700 | 1 | _aZhang, Yu-Xin | |
| 700 | 1 | _aCheng, Chia-Yao | |
| 773 | 0 |
_tJournal of nanoscience and nanotechnology _gvol. 19 _gno. 4 _gp. 2189-2192 |
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| 856 | 4 | 0 |
_uhttps://doi.org/10.1166/jnn.2019.15996 _zAvailable from publisher's website |
| 999 |
_c29101078 _d29101078 |
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