| 000 | 00833 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250517231622.0 | ||
| 264 | 0 | _c20180802 | |
| 008 | 201808s 0 0 eng d | ||
| 022 | _a1089-7623 | ||
| 024 | 7 |
_a10.1063/1.5025228 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aHamano, Akihide | |
| 245 | 0 | 0 |
_aSemiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source. _h[electronic resource] |
| 260 |
_bThe Review of scientific instruments _cJul 2018 |
||
| 300 |
_a073701 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aOhno, Seigo | |
| 700 | 1 | _aMinamide, Hiroaki | |
| 700 | 1 | _aIto, Hiromasa | |
| 773 | 0 |
_tThe Review of scientific instruments _gvol. 89 _gno. 7 _gp. 073701 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.5025228 _zAvailable from publisher's website |
| 999 |
_c28691155 _d28691155 |
||