| 000 | 00847 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250517224540.0 | ||
| 264 | 0 | _c20180702 | |
| 008 | 201807s 0 0 eng d | ||
| 022 | _a1089-7623 | ||
| 024 | 7 |
_a10.1063/1.5011065 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aWang, Hao | |
| 245 | 0 | 0 |
_aNote: Measurement of the cathode layer thickness in glow discharges with a Langmuir probe. _h[electronic resource] |
| 260 |
_bThe Review of scientific instruments _cJun 2018 |
||
| 300 |
_a066103 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aHou, Xinyu | |
| 700 | 1 | _aZou, Xiaobing | |
| 700 | 1 | _aLuo, Haiyun | |
| 700 | 1 | _aWang, Xinxin | |
| 773 | 0 |
_tThe Review of scientific instruments _gvol. 89 _gno. 6 _gp. 066103 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.5011065 _zAvailable from publisher's website |
| 999 |
_c28587015 _d28587015 |
||