000 00754 a2200193 4500
005 20250517224358.0
008 ####s 0 0 eng d
022 _a1533-4880
024 7 _a10.1166/jnn.2018.15462
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aChang, Yu-Chia
245 0 0 _aThe Micro-Analysis Estimation of 3D FinFET ICs in High Temperature Operation.
_h[electronic resource]
260 _bJournal of nanoscience and nanotechnology
_c10 2018
300 _a7100-7104 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aWu, Xiao-Jing
773 0 _tJournal of nanoscience and nanotechnology
_gvol. 18
_gno. 10
_gp. 7100-7104
856 4 0 _uhttps://doi.org/10.1166/jnn.2018.15462
_zAvailable from publisher's website
999 _c28581120
_d28581120