000 | 01651 a2200589 4500 | ||
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005 | 20250517203337.0 | ||
264 | 0 | _c20180302 | |
008 | 201803s 0 0 eng d | ||
022 | _a1089-7623 | ||
024 | 7 |
_a10.1063/1.5007950 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aZastrau, U | |
245 | 0 | 0 |
_aA sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution. _h[electronic resource] |
260 |
_bThe Review of scientific instruments _cFeb 2018 |
||
300 |
_a023703 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
700 | 1 | _aRödel, C | |
700 | 1 | _aNakatsutsumi, M | |
700 | 1 | _aFeigl, T | |
700 | 1 | _aAppel, K | |
700 | 1 | _aChen, B | |
700 | 1 | _aDöppner, T | |
700 | 1 | _aFennel, T | |
700 | 1 | _aFiedler, T | |
700 | 1 | _aFletcher, L B | |
700 | 1 | _aFörster, E | |
700 | 1 | _aGamboa, E | |
700 | 1 | _aGericke, D O | |
700 | 1 | _aGöde, S | |
700 | 1 | _aGrote-Fortmann, C | |
700 | 1 | _aHilbert, V | |
700 | 1 | _aKazak, L | |
700 | 1 | _aLaarmann, T | |
700 | 1 | _aLee, H J | |
700 | 1 | _aMabey, P | |
700 | 1 | _aMartinez, F | |
700 | 1 | _aMeiwes-Broer, K-H | |
700 | 1 | _aPauer, H | |
700 | 1 | _aPerske, M | |
700 | 1 | _aPrzystawik, A | |
700 | 1 | _aRoling, S | |
700 | 1 | _aSkruszewicz, S | |
700 | 1 | _aShihab, M | |
700 | 1 | _aTiggesbäumker, J | |
700 | 1 | _aToleikis, S | |
700 | 1 | _aWünsche, M | |
700 | 1 | _aZacharias, H | |
700 | 1 | _aGlenzer, S H | |
700 | 1 | _aGregori, G | |
773 | 0 |
_tThe Review of scientific instruments _gvol. 89 _gno. 2 _gp. 023703 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.5007950 _zAvailable from publisher's website |
999 |
_c28136699 _d28136699 |