000 00859 a2200241 4500
005 20250517194552.0
264 0 _c20180502
008 201805s 0 0 eng d
022 _a1943-3530
024 7 _a10.1177/0003702818756652
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aSurmick, David M
245 0 0 _aUncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra.
_h[electronic resource]
260 _bApplied spectroscopy
_cMay 2018
300 _a787-792 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aBoukari, Hacene
700 1 _aWoodward, Jonathan
700 1 _aStowe, Ashley C
700 1 _aMelikechi, Noureddine
773 0 _tApplied spectroscopy
_gvol. 72
_gno. 5
_gp. 787-792
856 4 0 _uhttps://doi.org/10.1177/0003702818756652
_zAvailable from publisher's website
999 _c27982510
_d27982510