| 000 | 00851 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250517175533.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a1365-2818 | ||
| 024 | 7 |
_a10.1111/jmi.12654 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aNorris, D J | |
| 245 | 0 | 0 |
_aComparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers. _h[electronic resource] |
| 260 |
_bJournal of microscopy _c12 2017 |
||
| 300 |
_a288-297 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aMyronov, M | |
| 700 | 1 | _aLeadley, D R | |
| 700 | 1 | _aWalther, T | |
| 773 | 0 |
_tJournal of microscopy _gvol. 268 _gno. 3 _gp. 288-297 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1111/jmi.12654 _zAvailable from publisher's website |
| 999 |
_c27626321 _d27626321 |
||