| 000 | 00799 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250517170655.0 | ||
| 264 | 0 | _c20190221 | |
| 008 | 201902s 0 0 eng d | ||
| 022 | _a2045-2322 | ||
| 024 | 7 |
_a10.1038/s41598-017-06613-1 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aWoo, Hyunsuk | |
| 245 | 0 | 0 |
_aMicrosecond Pulse I-V Approach to Understanding Defects in High Mobility Bi-layer Oxide Semiconductor Transistor. _h[electronic resource] |
| 260 |
_bScientific reports _c08 2017 |
||
| 300 |
_a8235 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aJeon, Sanghun | |
| 773 | 0 |
_tScientific reports _gvol. 7 _gno. 1 _gp. 8235 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1038/s41598-017-06613-1 _zAvailable from publisher's website |
| 999 |
_c27468859 _d27468859 |
||