000 00984 a2200301 4500
005 20250517165954.0
264 0 _c20180207
008 201802s 0 0 eng d
022 _a1094-4087
024 7 _a10.1364/OE.25.015624
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aMarschall, Felix
245 0 0 _aZone plates as imaging analyzers for resonant inelastic x-ray scattering.
_h[electronic resource]
260 _bOptics express
_cJul 2017
300 _a15624-15634 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aMcNally, Daniel
700 1 _aGuzenko, Vitaliy A
700 1 _aRösner, Benedikt
700 1 _aDantz, Marcus
700 1 _aLu, Xingye
700 1 _aNue, Leonard
700 1 _aStrocov, Vladimir
700 1 _aSchmitt, Thorsten
700 1 _aDavid, Christian
773 0 _tOptics express
_gvol. 25
_gno. 14
_gp. 15624-15634
856 4 0 _uhttps://doi.org/10.1364/OE.25.015624
_zAvailable from publisher's website
999 _c27446866
_d27446866