000 00863 a2200229 4500
005 20250517162139.0
264 0 _c20180205
008 201802s 0 0 eng d
022 _a2053-2733
024 7 _a10.1107/S2053273317008592
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aHansford, G M
245 0 0 _aHigh-resolution X-ray diffraction with no sample preparation.
_h[electronic resource]
260 _bActa crystallographica. Section A, Foundations and advances
_cJul 2017
300 _a293-311 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aTurner, S M R
700 1 _aDegryse, P
700 1 _aShortland, A J
773 0 _tActa crystallographica. Section A, Foundations and advances
_gvol. 73
_gno. Pt 4
_gp. 293-311
856 4 0 _uhttps://doi.org/10.1107/S2053273317008592
_zAvailable from publisher's website
999 _c27322438
_d27322438