000 01021 a2200325 4500
005 20250517161201.0
264 0 _c20180723
008 201807s 0 0 eng d
022 _a1361-6528
024 7 _a10.1088/1361-6528/aa7a50
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aVieira, E M F
245 0 0 _aSiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO
_h[electronic resource]
260 _bNanotechnology
_cAug 2017
300 _a345701 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aToudert, J
700 1 _aRolo, A G
700 1 _aParisini, A
700 1 _aLeitão, J P
700 1 _aCorreia, M R
700 1 _aFranco, N
700 1 _aAlves, E
700 1 _aChahboun, A
700 1 _aMartín-Sánchez, J
700 1 _aSerna, R
700 1 _aGomes, M J M
773 0 _tNanotechnology
_gvol. 28
_gno. 34
_gp. 345701
856 4 0 _uhttps://doi.org/10.1088/1361-6528/aa7a50
_zAvailable from publisher's website
999 _c27291011
_d27291011