000 00879 a2200241 4500
005 20250517151231.0
264 0 _c20180720
008 201807s 0 0 eng d
022 _a2040-3372
024 7 _a10.1039/c6nr09675a
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aSomnath, Suhas
245 0 0 _aImproved spatial resolution for spot sampling in thermal desorption atomic force microscopy - mass spectrometry via rapid heating functions.
_h[electronic resource]
260 _bNanoscale
_cMay 2017
300 _a5708-5717 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aJesse, Stephen
700 1 _aVan Berkel, Gary J
700 1 _aKalinin, Sergei V
700 1 _aOvchinnikova, Olga S
773 0 _tNanoscale
_gvol. 9
_gno. 17
_gp. 5708-5717
856 4 0 _uhttps://doi.org/10.1039/c6nr09675a
_zAvailable from publisher's website
999 _c27096954
_d27096954