| 000 | 00880 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250517145918.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a0021-8898 | ||
| 024 | 7 |
_a10.1107/S1600576717000565 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aKriegner, Dominik | |
| 245 | 0 | 0 |
_aTwin domain imaging in topological insulator Bi _h[electronic resource] |
| 260 |
_bJournal of applied crystallography _cApr 2017 |
||
| 300 |
_a369-377 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aHarcuba, Petr | |
| 700 | 1 | _aVeselý, Jozef | |
| 700 | 1 | _aLesnik, Andreas | |
| 700 | 1 | _aBauer, Guenther | |
| 700 | 1 | _aSpringholz, Gunther | |
| 700 | 1 | _aHolý, Václav | |
| 773 | 0 |
_tJournal of applied crystallography _gvol. 50 _gno. Pt 2 _gp. 369-377 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1107/S1600576717000565 _zAvailable from publisher's website |
| 999 |
_c27054132 _d27054132 |
||