| 000 | 00868 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250517145221.0 | ||
| 008 | ####s 0 0 eng d | ||
| 022 | _a1931-7573 | ||
| 024 | 7 |
_a10.1186/s11671-017-2018-8 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aWang, Xing | |
| 245 | 0 | 0 |
_aStructural Properties Characterized by the Film Thickness and Annealing Temperature for La _h[electronic resource] |
| 260 |
_bNanoscale research letters _cDec 2017 |
||
| 300 |
_a233 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aLiu, Hongxia | |
| 700 | 1 | _aZhao, Lu | |
| 700 | 1 | _aFei, Chenxi | |
| 700 | 1 | _aFeng, Xingyao | |
| 700 | 1 | _aChen, Shupeng | |
| 700 | 1 | _aWang, Yongte | |
| 773 | 0 |
_tNanoscale research letters _gvol. 12 _gno. 1 _gp. 233 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1186/s11671-017-2018-8 _zAvailable from publisher's website |
| 999 |
_c27031825 _d27031825 |
||