000 00947 a2200301 4500
005 20250517143544.0
264 0 _c20180723
008 201807s 0 0 eng d
022 _a1361-6528
024 7 _a10.1088/1361-6528/aa6763
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aLee, Keundong
245 0 0 _aFlexible resistive random access memory devices by using NiO
_h[electronic resource]
260 _bNanotechnology
_cMay 2017
300 _a205202 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aPark, Jong-Woo
700 1 _aTchoe, Youngbin
700 1 _aYoon, Jiyoung
700 1 _aChung, Kunook
700 1 _aYoon, Hosang
700 1 _aLee, Sangik
700 1 _aYoon, Chansoo
700 1 _aHo Park, Bae
700 1 _aYi, Gyu-Chul
773 0 _tNanotechnology
_gvol. 28
_gno. 20
_gp. 205202
856 4 0 _uhttps://doi.org/10.1088/1361-6528/aa6763
_zAvailable from publisher's website
999 _c26978063
_d26978063