| 000 | 00916 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250517141849.0 | ||
| 264 | 0 | _c20180124 | |
| 008 | 201801s 0 0 eng d | ||
| 022 | _a1878-4291 | ||
| 024 | 7 |
_a10.1016/j.micron.2017.02.002 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aHettler, Simon | |
| 245 | 0 | 0 |
_aCarbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications. _h[electronic resource] |
| 260 |
_bMicron (Oxford, England : 1993) _cMay 2017 |
||
| 300 |
_a38-47 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aDries, Manuel | |
| 700 | 1 | _aHermann, Peter | |
| 700 | 1 | _aObermair, Martin | |
| 700 | 1 | _aGerthsen, Dagmar | |
| 700 | 1 | _aMalac, Marek | |
| 773 | 0 |
_tMicron (Oxford, England : 1993) _gvol. 96 _gp. 38-47 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.micron.2017.02.002 _zAvailable from publisher's website |
| 999 |
_c26925391 _d26925391 |
||