000 00930 a2200253 4500
005 20250517135546.0
264 0 _c20180205
008 201802s 0 0 eng d
022 _a1539-4522
024 7 _a10.1364/AO.56.00C181
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aLequime, Michel
245 0 0 _aDetermination of the optical constants of a dielectric layer by processing in situ spectral transmittance measurements along the time dimension.
_h[electronic resource]
260 _bApplied optics
_cFeb 2017
300 _aC181-C187 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aNadji, Séverin L
700 1 _aStojcevski, Dragan
700 1 _aKoc, Cihan
700 1 _aGrézes-Besset, Catherine
700 1 _aLumeau, Julien
773 0 _tApplied optics
_gvol. 56
_gno. 4
_gp. C181-C187
856 4 0 _uhttps://doi.org/10.1364/AO.56.00C181
_zAvailable from publisher's website
999 _c26847403
_d26847403