000 | 00762 a2200181 4500 | ||
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005 | 20250517131929.0 | ||
008 | ####s 0 0 eng d | ||
022 | _a1044-677X | ||
024 | 7 |
_a10.6028/jres.103.009 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aEppeldauer, George | |
245 | 0 | 0 |
_aChopped Radiation Measurements With Large Area Si Photodiodes. _h[electronic resource] |
260 |
_bJournal of research of the National Institute of Standards and Technology _c |
||
300 |
_a153-162 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
773 | 0 |
_tJournal of research of the National Institute of Standards and Technology _gvol. 103 _gno. 2 _gp. 153-162 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.6028/jres.103.009 _zAvailable from publisher's website |
999 |
_c26726434 _d26726434 |