000			01095 a2200277 4500
005			20250517131246.0
264		0	_c20170808
008			201708s 0 0 eng d
022			_a2156-8944
024	7		_a10.1021/acscombsci.6b00142 _2doi
040			_aNLM _beng _cNLM
100	1		_aHernández-Rivera, Efraín
245	0	0	_aUsing Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns. _h[electronic resource]
260			_bACS combinatorial science _c01 2017
300			_a25-36 p. _bdigital
500			_aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
650	0	4	_aCluster Analysis
650	0	4	_aHigh-Throughput Screening Assays _xmethods
650	0	4	_aNormal Distribution
650	0	4	_aPowder Diffraction _xmethods
650	0	4	_aX-Ray Diffraction _xmethods
700	1		_aColeman, Shawn P
700	1		_aTschopp, Mark A
773	0		_tACS combinatorial science _gvol. 19 _gno. 1 _gp. 25-36
856	4	0	_uhttps://doi.org/10.1021/acscombsci.6b00142 _zAvailable from publisher's website
999			_c26704675 _d26704675