000 00801 a2200229 4500
005 20250517125932.0
264 0 _c20180129
008 201801s 0 0 eng d
022 _a1089-7623
024 7 _a10.1063/1.4959914
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aRuiz, C
245 0 0 _aSensitivity of MSE measurements on the beam atomic level population.
_h[electronic resource]
260 _bThe Review of scientific instruments
_cNov 2016
300 _a11E716 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aKumar, S T A
700 1 _aAnderson, F S B
700 1 _aAnderson, D T
773 0 _tThe Review of scientific instruments
_gvol. 87
_gno. 11
_gp. 11E716
856 4 0 _uhttps://doi.org/10.1063/1.4959914
_zAvailable from publisher's website
999 _c26660489
_d26660489