| 000 | 00919 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250517103013.0 | ||
| 264 | 0 | _c20180827 | |
| 008 | 201808s 0 0 eng d | ||
| 022 | _a1530-6992 | ||
| 024 | 7 |
_a10.1021/acs.nanolett.6b01560 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aBufford, Daniel C | |
| 245 | 0 | 0 |
_aHigh Cycle Fatigue in the Transmission Electron Microscope. _h[electronic resource] |
| 260 |
_bNano letters _c08 2016 |
||
| 300 |
_a4946-53 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 700 | 1 | _aStauffer, Douglas | |
| 700 | 1 | _aMook, William M | |
| 700 | 1 | _aSyed Asif, S A | |
| 700 | 1 | _aBoyce, Brad L | |
| 700 | 1 | _aHattar, Khalid | |
| 773 | 0 |
_tNano letters _gvol. 16 _gno. 8 _gp. 4946-53 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1021/acs.nanolett.6b01560 _zAvailable from publisher's website |
| 999 |
_c26168323 _d26168323 |
||