| 000 | 00801 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250517093848.0 | ||
| 264 | 0 | _c20180316 | |
| 008 | 201803s 0 0 eng d | ||
| 022 | _a2045-2322 | ||
| 024 | 7 |
_a10.1038/srep25580 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aZheng, Yan-Zong | |
| 245 | 0 | 0 |
_aDepth profiles of the interfacial strains of Si0.7Ge0.3/Si using three-beam Bragg-surface diffraction. _h[electronic resource] |
| 260 |
_bScientific reports _c05 2016 |
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| 300 |
_a25580 p. _bdigital |
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| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aSoo, Yun-Liang | |
| 700 | 1 | _aChang, Shih-Lin | |
| 773 | 0 |
_tScientific reports _gvol. 6 _gp. 25580 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1038/srep25580 _zAvailable from publisher's website |
| 999 |
_c25998687 _d25998687 |
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