000 01023 a2200289 4500
005 20250517075629.0
264 0 _c20160614
008 201606s 0 0 eng d
022 _a1094-4087
024 7 _a10.1364/OE.23.033249
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aSukhdeo, David S
245 0 0 _aGe microdisk with lithographically-tunable strain using CMOS-compatible process.
_h[electronic resource]
260 _bOptics express
_cDec 2015
300 _a33249-54 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
700 1 _aPetykiewicz, Jan
700 1 _aGupta, Shashank
700 1 _aKim, Daeik
700 1 _aWoo, Sungdae
700 1 _aKim, Youngmin
700 1 _aVučković, Jelena
700 1 _aSaraswat, Krishna C
700 1 _aNam, Donguk
773 0 _tOptics express
_gvol. 23
_gno. 26
_gp. 33249-54
856 4 0 _uhttps://doi.org/10.1364/OE.23.033249
_zAvailable from publisher's website
999 _c25689789
_d25689789