| 000 | 00927 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250517074715.0 | ||
| 264 | 0 | _c20160818 | |
| 008 | 201608s 0 0 eng d | ||
| 022 | _a1097-0029 | ||
| 024 | 7 |
_a10.1002/jemt.22627 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aMa, Bingyang | |
| 245 | 0 | 0 |
_aAn improved preparation method for cross-sectional TEM specimens of films deposited on metallic substrates. _h[electronic resource] |
| 260 |
_bMicroscopy research and technique _cApr 2016 |
||
| 300 |
_a276-9 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aShi, Kaicheng | |
| 700 | 1 | _aShang, Hailong | |
| 700 | 1 | _aZhang, Anming | |
| 700 | 1 | _aLi, Rongbin | |
| 700 | 1 | _aLi, Geyang | |
| 773 | 0 |
_tMicroscopy research and technique _gvol. 79 _gno. 4 _gp. 276-9 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/jemt.22627 _zAvailable from publisher's website |
| 999 |
_c25663830 _d25663830 |
||