| 000 | 01016 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250517064948.0 | ||
| 264 | 0 | _c20160425 | |
| 008 | 201604s 0 0 eng d | ||
| 022 | _a1944-8252 | ||
| 024 | 7 |
_a10.1021/acsami.5b09261 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aBordes, Arnaud | |
| 245 | 0 | 0 |
_aInvestigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM. _h[electronic resource] |
| 260 |
_bACS applied materials & interfaces _cDec 2015 |
||
| 300 |
_a27853-62 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aDe Vito, Eric | |
| 700 | 1 | _aHaon, Cédric | |
| 700 | 1 | _aSecouard, Christophe | |
| 700 | 1 | _aMontani, Alexandre | |
| 700 | 1 | _aMarcus, Philippe | |
| 773 | 0 |
_tACS applied materials & interfaces _gvol. 7 _gno. 50 _gp. 27853-62 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1021/acsami.5b09261 _zAvailable from publisher's website |
| 999 |
_c25496463 _d25496463 |
||