| 000 | 01039 a2200265 4500 | ||
|---|---|---|---|
| 005 | 20250517062156.0 | ||
| 264 | 0 | _c20161216 | |
| 008 | 201612s 0 0 eng d | ||
| 022 | _a1365-2818 | ||
| 024 | 7 |
_a10.1111/jmi.12347 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aFitzek, H | |
| 245 | 0 | 0 |
_aHigh-quality imaging in environmental scanning electron microscopy--optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. _h[electronic resource] |
| 260 |
_bJournal of microscopy _cApr 2016 |
||
| 300 |
_a85-91 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 | _aHydrostatic Pressure |
| 650 | 0 | 4 |
_aMicroscopy, Electron, Scanning _xinstrumentation |
| 700 | 1 | _aSchroettner, H | |
| 700 | 1 | _aWagner, J | |
| 700 | 1 | _aHofer, F | |
| 700 | 1 | _aRattenberger, J | |
| 773 | 0 |
_tJournal of microscopy _gvol. 262 _gno. 1 _gp. 85-91 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1111/jmi.12347 _zAvailable from publisher's website |
| 999 |
_c25422011 _d25422011 |
||