| 000 | 01080 a2200289 4500 | ||
|---|---|---|---|
| 005 | 20250517052712.0 | ||
| 264 | 0 | _c20151001 | |
| 008 | 201510s 0 0 eng d | ||
| 022 | _a1533-4899 | ||
| 024 | 7 |
_a10.1166/jnn.2015.9793 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aPark, Cheolmin | |
| 245 | 0 | 0 |
_aAnalysis of Resistance and Surface Recombination Velocities by Contact Coverage for Optimizing Electrical Loss in c-Si Local Back Contact. _h[electronic resource] |
| 260 |
_bJournal of nanoscience and nanotechnology _cJun 2015 |
||
| 300 |
_a4398-402 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aRyu, Kyungyul | |
| 700 | 1 | _aBalaji, Nagarajan | |
| 700 | 1 | _aLee, Seunghwan | |
| 700 | 1 | _aKim, Jungmo | |
| 700 | 1 | _aJu, Minkyu | |
| 700 | 1 | _aLee, Youn-Jung | |
| 700 | 1 | _aLee, Hoongjoo | |
| 700 | 1 | _aYi, Junsin | |
| 773 | 0 |
_tJournal of nanoscience and nanotechnology _gvol. 15 _gno. 6 _gp. 4398-402 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1166/jnn.2015.9793 _zAvailable from publisher's website |
| 999 |
_c25260448 _d25260448 |
||