000 00852 a2200229 4500
005 20250517052710.0
264 0 _c20151130
008 201511s 0 0 eng d
022 _a1539-4522
024 7 _a10.1364/AO.54.007997
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aVillalobos-Mendoza, Brenda
245 0 0 _aPhase shifting interferometry using a spatial light modulator to measure optical thin films.
_h[electronic resource]
260 _bApplied optics
_cSep 2015
300 _a7997-8003 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aGranados-Agustín, Fermín S
700 1 _aAguirre-Aguirre, Daniel
700 1 _aCornejo-Rodríguez, Alejandro
773 0 _tApplied optics
_gvol. 54
_gno. 26
_gp. 7997-8003
856 4 0 _uhttps://doi.org/10.1364/AO.54.007997
_zAvailable from publisher's website
999 _c25260369
_d25260369