| 000 | 00802 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250517044622.0 | ||
| 264 | 0 | _c20151014 | |
| 008 | 201510s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/26/34/345702 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aKumar, Mohit | |
| 245 | 0 | 0 |
_aStructural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy. _h[electronic resource] |
| 260 |
_bNanotechnology _cAug 2015 |
||
| 300 |
_a345702 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aSom, Tapobrata | |
| 773 | 0 |
_tNanotechnology _gvol. 26 _gno. 34 _gp. 345702 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/26/34/345702 _zAvailable from publisher's website |
| 999 |
_c25140225 _d25140225 |
||