000 01047 a2200313 4500
005 20250517044313.0
264 0 _c20151007
008 201510s 0 0 eng d
022 _a1089-7623
024 7 _a10.1063/1.4926350
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aNaka, T
245 0 0 _aAnalysis system of submicron particle tracks in the fine-grained nuclear emulsion by a combination of hard x-ray and optical microscopy.
_h[electronic resource]
260 _bThe Review of scientific instruments
_cJul 2015
300 _a073701 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aAsada, T
700 1 _aYoshimoto, M
700 1 _aKatsuragawa, T
700 1 _aSuzuki, Y
700 1 _aTerada, Y
700 1 _aTakeuchi, A
700 1 _aUesugi, K
700 1 _aTawara, Y
700 1 _aUmemoto, A
700 1 _aKimura, M
773 0 _tThe Review of scientific instruments
_gvol. 86
_gno. 7
_gp. 073701
856 4 0 _uhttps://doi.org/10.1063/1.4926350
_zAvailable from publisher's website
999 _c25130623
_d25130623