| 000 | 00869 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250517024117.0 | ||
| 264 | 0 | _c20150522 | |
| 008 | 201505s 0 0 eng d | ||
| 022 | _a1089-7623 | ||
| 024 | 7 |
_a10.1063/1.4914894 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aMarkushev, D D | |
| 245 | 0 | 0 |
_aPhotoacoustic signal and noise analysis for Si thin plate: signal correction in frequency domain. _h[electronic resource] |
| 260 |
_bThe Review of scientific instruments _cMar 2015 |
||
| 300 |
_a035110 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aRabasović, M D | |
| 700 | 1 | _aTodorović, D M | |
| 700 | 1 | _aGalović, S | |
| 700 | 1 | _aBialkowski, S E | |
| 773 | 0 |
_tThe Review of scientific instruments _gvol. 86 _gno. 3 _gp. 035110 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.4914894 _zAvailable from publisher's website |
| 999 |
_c24764743 _d24764743 |
||