000 00760 a2200205 4500
005 20250517023532.0
264 0 _c20150515
008 201505s 0 0 eng d
022 _a1424-8220
024 7 _a10.3390/s150407206
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aFilipovic, Lado
245 0 0 _aPerformance and stress analysis of metal oxide films for CMOS-integrated gas sensors.
_h[electronic resource]
260 _bSensors (Basel, Switzerland)
_cMar 2015
300 _a7206-27 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aSelberherr, Siegfried
773 0 _tSensors (Basel, Switzerland)
_gvol. 15
_gno. 4
_gp. 7206-27
856 4 0 _uhttps://doi.org/10.3390/s150407206
_zAvailable from publisher's website
999 _c24748409
_d24748409