| 000 | 00828 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250517011306.0 | ||
| 264 | 0 | _c20150330 | |
| 008 | 201503s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/26/3/035702 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aLiu, Y | |
| 245 | 0 | 0 |
_aDetermining charge state of graphene vacancy by noncontact atomic force microscopy and first-principles calculations. _h[electronic resource] |
| 260 |
_bNanotechnology _cJan 2015 |
||
| 300 |
_a035702 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 700 | 1 | _aWeinert, M | |
| 700 | 1 | _aLi, L | |
| 773 | 0 |
_tNanotechnology _gvol. 26 _gno. 3 _gp. 035702 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/26/3/035702 _zAvailable from publisher's website |
| 999 |
_c24496584 _d24496584 |
||