000 01130 a2200325 4500
005 20250517003746.0
264 0 _c20150521
008 201505s 0 0 eng d
022 _a2045-2322
024 7 _a10.1038/srep07263
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aChoi, Jin Sik
245 0 0 _aCorrelation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene.
_h[electronic resource]
260 _bScientific reports
_cDec 2014
300 _a7263 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
700 1 _aChang, Young Jun
700 1 _aWoo, Sungjong
700 1 _aSon, Young-Woo
700 1 _aPark, Yeonggu
700 1 _aLee, Mi Jung
700 1 _aByun, Ik-Su
700 1 _aKim, Jin-Soo
700 1 _aChoi, Choon-Gi
700 1 _aBostwick, Aaron
700 1 _aRotenberg, Eli
700 1 _aPark, Bae Ho
773 0 _tScientific reports
_gvol. 4
_gp. 7263
856 4 0 _uhttps://doi.org/10.1038/srep07263
_zAvailable from publisher's website
999 _c24389608
_d24389608