000 | 01130 a2200325 4500 | ||
---|---|---|---|
005 | 20250517003746.0 | ||
264 | 0 | _c20150521 | |
008 | 201505s 0 0 eng d | ||
022 | _a2045-2322 | ||
024 | 7 |
_a10.1038/srep07263 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aChoi, Jin Sik | |
245 | 0 | 0 |
_aCorrelation between micrometer-scale ripple alignment and atomic-scale crystallographic orientation of monolayer graphene. _h[electronic resource] |
260 |
_bScientific reports _cDec 2014 |
||
300 |
_a7263 p. _bdigital |
||
500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. | ||
700 | 1 | _aChang, Young Jun | |
700 | 1 | _aWoo, Sungjong | |
700 | 1 | _aSon, Young-Woo | |
700 | 1 | _aPark, Yeonggu | |
700 | 1 | _aLee, Mi Jung | |
700 | 1 | _aByun, Ik-Su | |
700 | 1 | _aKim, Jin-Soo | |
700 | 1 | _aChoi, Choon-Gi | |
700 | 1 | _aBostwick, Aaron | |
700 | 1 | _aRotenberg, Eli | |
700 | 1 | _aPark, Bae Ho | |
773 | 0 |
_tScientific reports _gvol. 4 _gp. 7263 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1038/srep07263 _zAvailable from publisher's website |
999 |
_c24389608 _d24389608 |