| 000 | 00786 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250517003017.0 | ||
| 264 | 0 | _c20150330 | |
| 008 | 201503s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/25/49/495701 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aFumagalli, L | |
| 245 | 0 | 0 |
_aQuantitative electrostatic force microscopy with sharp silicon tips. _h[electronic resource] |
| 260 |
_bNanotechnology _cDec 2014 |
||
| 300 |
_a495701 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aEdwards, M A | |
| 700 | 1 | _aGomila, G | |
| 773 | 0 |
_tNanotechnology _gvol. 25 _gno. 49 _gp. 495701 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/25/49/495701 _zAvailable from publisher's website |
| 999 |
_c24364016 _d24364016 |
||