000 00945 a2200253 4500
005 20250516234501.0
264 0 _c20150511
008 201505s 0 0 eng d
022 _a1530-6992
024 7 _a10.1021/nl5026166
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aGrumstrup, Erik M
245 0 0 _aReversible strain-induced electron-hole recombination in silicon nanowires observed with femtosecond pump-probe microscopy.
_h[electronic resource]
260 _bNano letters
_cNov 2014
300 _a6287-92 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
700 1 _aGabriel, Michelle M
700 1 _aPinion, Christopher W
700 1 _aParker, James K
700 1 _aCahoon, James F
700 1 _aPapanikolas, John M
773 0 _tNano letters
_gvol. 14
_gno. 11
_gp. 6287-92
856 4 0 _uhttps://doi.org/10.1021/nl5026166
_zAvailable from publisher's website
999 _c24226294
_d24226294