000 01191 a2200349 4500
005 20250516230110.0
264 0 _c20150420
008 201504s 0 0 eng d
022 _a1537-744X
024 7 _a10.1155/2014/807693
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aMi, Jinhua
245 0 0 _aThermal cycling life prediction of Sn-3.0Ag-0.5Cu solder joint using type-I censored data.
_h[electronic resource]
260 _bTheScientificWorldJournal
_c2014
300 _a807693 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
650 0 4 _aCopper
_xchemistry
650 0 4 _aElectronics
650 0 4 _aEquipment Failure Analysis
650 0 4 _aHot Temperature
650 0 4 _aMaterials Testing
650 0 4 _aMicroscopy, Electron, Scanning
650 0 4 _aModels, Chemical
650 0 4 _aSilver
_xchemistry
650 0 4 _aTin Compounds
_xchemistry
700 1 _aLi, Yan-Feng
700 1 _aYang, Yuan-Jian
700 1 _aPeng, Weiwen
700 1 _aHuang, Hong-Zhong
773 0 _tTheScientificWorldJournal
_gvol. 2014
_gp. 807693
856 4 0 _uhttps://doi.org/10.1155/2014/807693
_zAvailable from publisher's website
999 _c24096220
_d24096220