| 000 | 00996 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250512000141.0 | ||
| 264 | 0 | _c19901004 | |
| 008 | 199010s 0 0 eng d | ||
| 022 | _a0741-0581 | ||
| 024 | 7 |
_a10.1002/jemt.1060150409 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aTanji, T | |
| 245 | 0 | 0 |
_aScanning image detection (SID) system for conventional transmission electron microscope (CTEM) images. _h[electronic resource] |
| 260 |
_bJournal of electron microscopy technique _cAug 1990 |
||
| 300 |
_a397-9 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 |
_aImage Processing, Computer-Assisted _xinstrumentation |
| 650 | 0 | 4 | _aMagnesium Oxide |
| 650 | 0 | 4 |
_aMicroscopy, Electron _xmethods |
| 700 | 1 | _aTomita, M | |
| 700 | 1 | _aKobayashi, H | |
| 773 | 0 |
_tJournal of electron microscopy technique _gvol. 15 _gno. 4 _gp. 397-9 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/jemt.1060150409 _zAvailable from publisher's website |
| 999 |
_c2397632 _d2397632 |
||