| 000 | 00997 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250516213609.0 | ||
| 264 | 0 | _c20150415 | |
| 008 | 201504s 0 0 eng d | ||
| 022 | _a1435-8115 | ||
| 024 | 7 |
_a10.1017/S1431927614000920 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aStéphan, Odile | |
| 245 | 0 | 0 |
_aEnhanced data generated with electrons (EDGE) special issue introduction. _h[electronic resource] |
| 260 |
_bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _cJun 2014 |
||
| 300 |
_a647-8 p. _bdigital |
||
| 500 | _aPublication Type: Introductory Journal Article | ||
| 700 | 1 | _aMidgley, Paul | |
| 773 | 0 |
_tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _gvol. 20 _gno. 3 _gp. 647-8 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1017/S1431927614000920 _zAvailable from publisher's website |
| 999 |
_c23847417 _d23847417 |
||