000 00762 a2200217 4500
005 20250516203218.0
264 0 _c20141118
008 201411s 0 0 eng d
022 _a1744-6848
024 7 _a10.1039/c3sm52817k
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aWoods, David A
245 0 0 _aTotal internal reflection spectroscopy for studying soft matter.
_h[electronic resource]
260 _bSoft matter
_cFeb 2014
300 _a1071-96 p.
_bdigital
500 _aPublication Type: Journal Article; Review
650 0 4 _aSpectrum Analysis, Raman
_xinstrumentation
700 1 _aBain, Colin D
773 0 _tSoft matter
_gvol. 10
_gno. 8
_gp. 1071-96
856 4 0 _uhttps://doi.org/10.1039/c3sm52817k
_zAvailable from publisher's website
999 _c23660893
_d23660893