000 00954 a2200241 4500
005 20250516193114.0
264 0 _c20150330
008 201503s 0 0 eng d
022 _a1878-4291
024 7 _a10.1016/j.micron.2013.12.009
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aMartinez, G T
245 0 0 _aThe effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images.
_h[electronic resource]
260 _bMicron (Oxford, England : 1993)
_cAug 2014
300 _a57-63 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1 _aDe Backer, A
700 1 _aRosenauer, A
700 1 _aVerbeeck, J
700 1 _aVan Aert, S
773 0 _tMicron (Oxford, England : 1993)
_gvol. 63
_gp. 57-63
856 4 0 _uhttps://doi.org/10.1016/j.micron.2013.12.009
_zAvailable from publisher's website
999 _c23484110
_d23484110