000 | 00998 a2200289 4500 | ||
---|---|---|---|
005 | 20250516192802.0 | ||
264 | 0 | _c20140623 | |
008 | 201406s 0 0 eng d | ||
022 | _a1424-8220 | ||
024 | 7 |
_a10.3390/s140100877 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aLazar, Josef | |
245 | 0 | 0 |
_aShort-range six-axis interferometer controlled positioning for scanning probe microscopy. _h[electronic resource] |
260 |
_bSensors (Basel, Switzerland) _cJan 2014 |
||
300 |
_a877-86 p. _bdigital |
||
500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
700 | 1 | _aKlapetek, Petr | |
700 | 1 | _aValtr, Miroslav | |
700 | 1 | _aHrabina, Jan | |
700 | 1 | _aBuchta, Zdenek | |
700 | 1 | _aCip, Onrej | |
700 | 1 | _aCizek, Martin | |
700 | 1 | _aOulehla, Jindrich | |
700 | 1 | _aSery, Mojmir | |
773 | 0 |
_tSensors (Basel, Switzerland) _gvol. 14 _gno. 1 _gp. 877-86 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.3390/s140100877 _zAvailable from publisher's website |
999 |
_c23474051 _d23474051 |