| 000 | 01147 a2200337 4500 | ||
|---|---|---|---|
| 005 | 20250516163922.0 | ||
| 264 | 0 | _c20140313 | |
| 008 | 201403s 0 0 eng d | ||
| 022 | _a1094-4087 | ||
| 024 | 7 |
_a10.1364/OE.21.016431 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aBartl, D | |
| 245 | 0 | 0 |
_aProbing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques. _h[electronic resource] |
| 260 |
_bOptics express _cJul 2013 |
||
| 300 |
_a16431-43 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 |
_aConductometry _xmethods |
| 650 | 0 | 4 | _aLasers |
| 650 | 0 | 4 |
_aMaterials Testing _xmethods |
| 650 | 0 | 4 | _aMembranes, Artificial |
| 650 | 0 | 4 |
_aMolybdenum _xanalysis |
| 650 | 0 | 4 |
_aRefractometry _xmethods |
| 700 | 1 | _aAmetowobla, M | |
| 700 | 1 | _aSchmid, F | |
| 700 | 1 | _aLetsch, A | |
| 700 | 1 | _aHafner, M | |
| 700 | 1 | _aNolte, S | |
| 700 | 1 | _aTünnermann, A | |
| 773 | 0 |
_tOptics express _gvol. 21 _gno. 14 _gp. 16431-43 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/OE.21.016431 _zAvailable from publisher's website |
| 999 |
_c22997761 _d22997761 |
||