000 | 00880 a2200253 4500 | ||
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005 | 20250516161529.0 | ||
264 | 0 | _c20140414 | |
008 | 201404s 0 0 eng d | ||
022 | _a1879-2723 | ||
024 | 7 |
_a10.1016/j.ultramic.2013.05.019 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aZhang, Chao | |
245 | 0 | 0 |
_aThe use of a central beam stop for contrast enhancement in TEM imaging. _h[electronic resource] |
260 |
_bUltramicroscopy _cNov 2013 |
||
300 |
_a200-6 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
650 | 0 | 4 |
_aGraphite _xchemistry |
650 | 0 | 4 |
_aMicroscopy, Electron, Transmission _xmethods |
700 | 1 | _aXu, Qiang | |
700 | 1 | _aPeters, Peter J | |
700 | 1 | _aZandbergen, Henny | |
773 | 0 |
_tUltramicroscopy _gvol. 134 _gp. 200-6 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2013.05.019 _zAvailable from publisher's website |
999 |
_c22929249 _d22929249 |