000 00880 a2200253 4500
005 20250516161529.0
264 0 _c20140414
008 201404s 0 0 eng d
022 _a1879-2723
024 7 _a10.1016/j.ultramic.2013.05.019
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aZhang, Chao
245 0 0 _aThe use of a central beam stop for contrast enhancement in TEM imaging.
_h[electronic resource]
260 _bUltramicroscopy
_cNov 2013
300 _a200-6 p.
_bdigital
500 _aPublication Type: Journal Article
650 0 4 _aGraphite
_xchemistry
650 0 4 _aMicroscopy, Electron, Transmission
_xmethods
700 1 _aXu, Qiang
700 1 _aPeters, Peter J
700 1 _aZandbergen, Henny
773 0 _tUltramicroscopy
_gvol. 134
_gp. 200-6
856 4 0 _uhttps://doi.org/10.1016/j.ultramic.2013.05.019
_zAvailable from publisher's website
999 _c22929249
_d22929249