| 000 | 01196 a2200361 4500 | ||
|---|---|---|---|
| 005 | 20250516161402.0 | ||
| 264 | 0 | _c20130807 | |
| 008 | 201308s 0 0 eng d | ||
| 022 | _a1533-4880 | ||
| 024 | 7 |
_a10.1166/jnn.2013.7172 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aSun, Jong-Won | |
| 245 | 0 | 0 |
_aReduction process of dislocation and standby leakage current for embedded flash memory using nano-scale integration. _h[electronic resource] |
| 260 |
_bJournal of nanoscience and nanotechnology _cJun 2013 |
||
| 300 |
_a4291-6 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aPark, Ji Hwan | |
| 700 | 1 | _aYang, Taek-Seung | |
| 700 | 1 | _aChoi, Heesoo | |
| 700 | 1 | _aCui, Yinhua | |
| 700 | 1 | _aChoi, Eunmi | |
| 700 | 1 | _aKim, Areum | |
| 700 | 1 | _aOh, Lee Seul | |
| 700 | 1 | _aLee, Sun Jae | |
| 700 | 1 | _aPark, Hyunjin | |
| 700 | 1 | _aKim, Chang Hyun | |
| 700 | 1 | _aKim, Soo-Kil | |
| 700 | 1 | _aSon, Hyungbin | |
| 700 | 1 | _aLee, Dong Hyun | |
| 700 | 1 | _aPyo, Sung Gyu | |
| 773 | 0 |
_tJournal of nanoscience and nanotechnology _gvol. 13 _gno. 6 _gp. 4291-6 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1166/jnn.2013.7172 _zAvailable from publisher's website |
| 999 |
_c22924897 _d22924897 |
||