| 000 | 00869 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250516153743.0 | ||
| 264 | 0 | _c20140417 | |
| 008 | 201404s 0 0 eng d | ||
| 022 | _a1879-2723 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2013.04.011 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aRuggles, T J | |
| 245 | 0 | 0 |
_aEstimations of bulk geometrically necessary dislocation density using high resolution EBSD. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cOct 2013 |
||
| 300 |
_a8-15 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 650 | 0 | 4 | _aElectrons |
| 650 | 0 | 4 |
_aMicroscopy, Electron, Transmission _xmethods |
| 700 | 1 | _aFullwood, D T | |
| 773 | 0 |
_tUltramicroscopy _gvol. 133 _gp. 8-15 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2013.04.011 _zAvailable from publisher's website |
| 999 |
_c22822071 _d22822071 |
||