| 000 | 00859 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250516145948.0 | ||
| 264 | 0 | _c20131203 | |
| 008 | 201312s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/24/22/225703 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aMaragliano, C | |
| 245 | 0 | 0 |
_aDynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution. _h[electronic resource] |
| 260 |
_bNanotechnology _cJun 2013 |
||
| 300 |
_a225703 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aHeskes, D | |
| 700 | 1 | _aStefancich, M | |
| 700 | 1 | _aChiesa, M | |
| 700 | 1 | _aSouier, T | |
| 773 | 0 |
_tNanotechnology _gvol. 24 _gno. 22 _gp. 225703 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/24/22/225703 _zAvailable from publisher's website |
| 999 |
_c22715952 _d22715952 |
||