000 01082 a2200337 4500
005 20250516143829.0
264 0 _c20130919
008 201309s 0 0 eng d
022 _a1094-4087
024 7 _a10.1364/OE.21.008763
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aSeo, M
245 0 0 _aUltrafast optical wide field microscopy.
_h[electronic resource]
260 _bOptics express
_cApr 2013
300 _a8763-72 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.
650 0 4 _aEquipment Design
650 0 4 _aEquipment Failure Analysis
650 0 4 _aImage Enhancement
_xinstrumentation
650 0 4 _aMicroscopy
_xinstrumentation
700 1 _aBoubanga-Tombet, S
700 1 _aYoo, J
700 1 _aKu, Z
700 1 _aGin, A V
700 1 _aPicraux, S T
700 1 _aBrueck, S R J
700 1 _aTaylor, A J
700 1 _aPrasankumar, R P
773 0 _tOptics express
_gvol. 21
_gno. 7
_gp. 8763-72
856 4 0 _uhttps://doi.org/10.1364/OE.21.008763
_zAvailable from publisher's website
999 _c22655894
_d22655894