000 | 01082 a2200337 4500 | ||
---|---|---|---|
005 | 20250516143829.0 | ||
264 | 0 | _c20130919 | |
008 | 201309s 0 0 eng d | ||
022 | _a1094-4087 | ||
024 | 7 |
_a10.1364/OE.21.008763 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aSeo, M | |
245 | 0 | 0 |
_aUltrafast optical wide field microscopy. _h[electronic resource] |
260 |
_bOptics express _cApr 2013 |
||
300 |
_a8763-72 p. _bdigital |
||
500 | _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. | ||
650 | 0 | 4 | _aEquipment Design |
650 | 0 | 4 | _aEquipment Failure Analysis |
650 | 0 | 4 |
_aImage Enhancement _xinstrumentation |
650 | 0 | 4 |
_aMicroscopy _xinstrumentation |
700 | 1 | _aBoubanga-Tombet, S | |
700 | 1 | _aYoo, J | |
700 | 1 | _aKu, Z | |
700 | 1 | _aGin, A V | |
700 | 1 | _aPicraux, S T | |
700 | 1 | _aBrueck, S R J | |
700 | 1 | _aTaylor, A J | |
700 | 1 | _aPrasankumar, R P | |
773 | 0 |
_tOptics express _gvol. 21 _gno. 7 _gp. 8763-72 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1364/OE.21.008763 _zAvailable from publisher's website |
999 |
_c22655894 _d22655894 |