| 000 | 01260 a2200325 4500 | ||
|---|---|---|---|
| 005 | 20250516143416.0 | ||
| 264 | 0 | _c20130628 | |
| 008 | 201306s 0 0 eng d | ||
| 022 | _a1938-5404 | ||
| 024 | 7 |
_a10.1667/RR3124.1 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aTaleei, Reza | |
| 245 | 0 | 0 |
_aThe non-homologous end-joining (NHEJ) mathematical model for the repair of double-strand breaks: II. Application to damage induced by ultrasoft X rays and low-energy electrons. _h[electronic resource] |
| 260 |
_bRadiation research _cMay 2013 |
||
| 300 |
_a540-8 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 | _aBase Sequence |
| 650 | 0 | 4 |
_aCarbon _xadverse effects |
| 650 | 0 | 4 |
_aDNA Breaks, Double-Stranded _xradiation effects |
| 650 | 0 | 4 |
_aDNA End-Joining Repair _xradiation effects |
| 650 | 0 | 4 |
_aElectrons _xadverse effects |
| 650 | 0 | 4 | _aKinetics |
| 650 | 0 | 4 | _aModels, Genetic |
| 650 | 0 | 4 |
_aX-Rays _xadverse effects |
| 700 | 1 | _aGirard, Peter M | |
| 700 | 1 | _aSankaranarayanan, Krishnaswami | |
| 700 | 1 | _aNikjoo, Hooshang | |
| 773 | 0 |
_tRadiation research _gvol. 179 _gno. 5 _gp. 540-8 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1667/RR3124.1 _zAvailable from publisher's website |
| 999 |
_c22644963 _d22644963 |
||