| 000 | 00762 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250516125452.0 | ||
| 264 | 0 | _c20131104 | |
| 008 | 201311s 0 0 eng d | ||
| 022 | _a1539-4522 | ||
| 024 | 7 |
_a10.1364/AO.51.008579 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aLi, Meng-Chi | |
| 245 | 0 | 0 |
_aApplication of white-light scanning interferometer on transparent thin-film measurement. _h[electronic resource] |
| 260 |
_bApplied optics _cDec 2012 |
||
| 300 |
_a8579-86 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aWan, Der-Shen | |
| 700 | 1 | _aLee, Cheng-Chung | |
| 773 | 0 |
_tApplied optics _gvol. 51 _gno. 36 _gp. 8579-86 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/AO.51.008579 _zAvailable from publisher's website |
| 999 |
_c22367430 _d22367430 |
||